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Reichenberg, B.
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Schneller, T.
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Waser, R.
Journal Article
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Journal Article
Contact mode potentiometric measurements with an atomic force microscope on high resistive perovskite thin films
Reichenberg, B.
2005
Journal of the European Ceramic Society, 25 (2005) S. 2353
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Peter, F.
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Reichenberg, B.
Schneller, T.
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Waser, R.
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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Center of Nanoelectronic Systems for Information Technology; CNI
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Elektronische Materialien; IFF-IEM
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