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Waser, R.
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Schindler, G.
Institut für Festkörperforschung; IFF
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Waser, R.
AND
Schindler, G.
Institut für Festkörperforschung; IFF
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1
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1
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1
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1
Conference Presentation
The influence of the experimental procedures on the reliability issues of ferroelectric thin films in view of memory applications
Grossmann, M.
2000
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2
Poster
Imprint properties of SBT thin films
Grossmann, M.
2000
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3
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Degradation mechanisms of SrBi2Ta2O9 ferroelectric thin film capacitors during forming gas annealing
Hartner, W.
2000
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4
Poster
Low-temperature-process and thin-SBT-films for ferroelectric memory devices
Mört, M.
2000
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5
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Origin of imprint in ferroelectricCSD SrBi2Ta2O9 thin films
Waser, R.
1999
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6
Talk (non-conference)
Influence of dry etching using argon on structural and electrical properties of crystalline and non-crystalline SrBi2Ta2O9
Hartner, W.
1999
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7
Journal Article
Influence of dry etching using argon on structural and electrical properties of crystalline and non-crystalline SrBi2Ta2O9
Hartner, W.
1999
Integrated ferroelectrics, 27 (1999)
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Hartner, W.
7
Schindler, G.
Waser, R.
Dehm, C.
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Bolten, D.
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Kastner, M.
3
Lohse, O.
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Mazure, I. A.
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Schroeder, H.
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Ahlstedt, M.
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Böttger, U.
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Weinreich, V.
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Kall, U.
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Nagel, D. R.
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Research Program
Festkörperforschung für die Informationstechnik
7
Contributing Institute
Institut für Festkörperforschung; IFF
Scientific Report
2000
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