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Elektronische Eigenschaften; IFF-9
Bürgler, Daniel
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Wiemann, C.
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Elektronische Eigenschaften; IFF-9
Bürgler, Daniel
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Wiemann, C.
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1
Journal Article
Depth-resolved soft x-ray photoelectron emission microscopy in nanostructures via standing-wave excited photoemission
Kronast, F.
2008
Applied physics letters, 93 (2008)
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Spectromicroscopy with depth resolution via standing wave exciation
Kronast, F.
2007
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2
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1
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Journal Article
1
Poster
1
Name
Bürgler, Daniel
Dürr, H. A.
2
Fadley, C.S.
2
Kaiser, A.
2
Kronast, F.
2
Ovsyannikov, R.
2
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Schneider, Claus Michael
2
Schreiber, R.
2
Wiemann, C.
Eberhardt, W.
1
Fischer, P.
1
Locatelli, A.
1
Salmassi, F.
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Yang, S.-H.
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Research Program
Grundlagen für zukünftige Informationstechnologien
2
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Elektronische Eigenschaften; IFF-9
JARA-FIT; JARA-FIT
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2007
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