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Elektronische Materialien; IFF-IEM
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Mikrostrukturforschung; IFF-IMF
Plonka, R.
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Elektronische Materialien; IFF-IEM
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Mikrostrukturforschung; IFF-IMF
Plonka, R.
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1
Poster
Thickness Dependent Dielectric Properties of Epitaxial Ba0.7Sr0.3TiO3 Thin Film Capacitors
Dittmann, R.
2006
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Impact of electrode interfaces on epitaxial Ba07Sr0.3TiO3 thin film capacitors
Dittmann, R.
2005
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Sharp ferroelectric phase transition in strained single-crystalline SRO/BST/SRO capacitors
Dittmann, R.
2004
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3
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Poster
2
Conference Presentation
1
Name
Dittmann, R.
3
Jia, C. L.
3
Plonka, R.
Vasco, E.
3
Waser, R.
3
He, J. Q.
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Pertsev, R. A.
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He, J.
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Hoffmann-Eifert, S.
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Pertsev, N. A.
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
2
Grundlagen für zukünftige Informationstechnologien
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Center of Nanoelectronic Systems for Information Technology; CNI
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Elektronische Materialien; IFF-IEM
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