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Institut für Halbleiterschichten und Bauelemente; ISG-1
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JARA-FIT; JARA-FIT
Contribution to a conference proceedings
Grundlagen für zukünftige Informationstechnologien
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Institut für Halbleiterschichten und Bauelemente; ISG-1
AND
JARA-FIT; JARA-FIT
Contribution to a conference proceedings
Grundlagen für zukünftige Informationstechnologien
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Contribution to a conference proceedings
Measurement of the Germanium fraction in strained and relaxed SiGe by Spectroscopic Ellipsometry
Moers, J.
2006
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Schottky-barrier height tuning using dopant segregation in Schottky-barrier MOSFETs on fully-depleted SOI
Knoch, J.
2006
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Mantl, S.
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Buca, Dan Mihai
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Grundlagen für zukünftige Informationstechnologien
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Center of Nanoelectronic Systems for Information Technology; CNI
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Institut für Halbleiterschichten und Bauelemente; ISG-1
JARA-FIT; JARA-FIT
Scientific Report
2006
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