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Zentralabteilung für Chemische Analysen; ZCH
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
2002
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Zentralabteilung für Chemische Analysen; ZCH
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
2002
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Determination of trace elements in high-purity materials using laser ablation ICP-MS and instrumental neutron activation analysis
Boulyga, S. F.
2002
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Trace and ultratrace analysis on small amount of platinum and palladium clusters by LA-ICP-MS
Pickhardt, C.
2002
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3
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Application of ICP-MS and LA-ICP-MS for trace and surface analysis in the microelectronics industry
Becker, J. S.
2002
ICP information newsletter, 27 (2002) S. 216
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Applications of inductively coupled plasma mass spectrometry and laser ablation inductively coupled plasma mass spectrometry in materials science
Becker, J. S.
2002
Spectrochimica acta / B, 57 (2002) S. 1805 - 1820
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2002
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