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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
Elektronische Materialien; IFF-IEM
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
Elektronische Materialien; IFF-IEM
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1
Journal Article
Influence of asymmetric oxide electrode structures on the interface capacity and the failure mechanisms in PZT thin films
Ellerkmann, U.
2003
Integrated ferroelectrics, 52 (2003) S. 63
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MOCVD of high-K ceramic thin films for the Gbit DRAM technology
Fitsilis, Fotios
2003
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Abhängigkeit des Leckstromes und der Dielektrizitätskonstanten in SrTiO3- und (Ba,Sr)TiO3-Dünnschichtkondensatoren von der Kontaktmetallisierung
Schmitz, S. I.
2003
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Lasersinterung keramischer Dünnschichten
Baldus, Karl Josef Oliver
2003
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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Elektronische Materialien; IFF-IEM
Center of Nanoelectronic Systems for Information Technology; CNI
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