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1999

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Talk (non-conference) 4 Journal Article 3 Conference Presentation 1 Contribution to a book 1 Contribution to a conference proceedings 1

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Talk (non-conference)

Contrast transfer of a Cs-corrected microscope

Lentzen, M.
1999

“...Thust, A....”

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Talk (non-conference)

Auf dem Weg zur Sub-Angström-Mikroskopie : materialwissenschaftliche Anwendung aberrationskorrigierter Elektronenmikroskopie

Lentzen, M.
1999

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Microelectrodes, capacitors and bioFETs : novel trends in silicon-based biochemical sensing

Schöning, M. J.
1999

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Journal Article

Microelectrodes, capacitors and bioFETs : novel trends in silicon-based biochemical sensing

Schöning, M. J.
1999

Biocybernetics and biomedical engineering, 19 (1999) S. 105

“...Thust, A....”

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Investigation of atomic displacements at a sigma3 {111} twin boundary in BaTiO3 by means of phase-retrieval electron microscopy

Jia, C. L.
1999

Physical review letters, 82 (1999) S. 5052 - 5055

“...Thust, A....”

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Journal Article

Atomic structure of a sigma=3, {111} twin-boundary junction in a BaTiO3 thin film

Jia, C. L.
1999

Philosophical magazine / Letters, 79 (1999) S. 99 - 106

“...Thust, A....”

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Talk (non-conference)

Materialuntersuchung mittels der Fokusvariationsmethode : neue Einblicke nahe 1 Angström Auflösung

Thust, A.
1999

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Conference Presentation

The use of the focal-series reconstruction technique in HRTEM for solving materials problems

Thust, A.
1999

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Talk (non-conference)

Rekonstruktion der Austrittswellenfunktion in der hochauflösenden Elektronenmikroskopie

Thust, A.
1999

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Publications database 9 Open Access 1

Talk (non-conference) 4 Journal Article 3 Conference Presentation 1 Contribution to a book 1 Contribution to a conference proceedings 1

Thust, A. 9 Urban, K. 3 Chen, J. 2 Glück, O. 2 Jia, C. L. 2 Kordos, P. 2 more ... Lentzen, M. 2 Lüth, H. 2 Schroth, P. 2 Schöning, Michael J. 2 Schütz, S. 2 Steffen, A. 2 Windirsch, U. 2 Rosenfeld, R. 1 see all ... less ...

Festkörperforschung für die Informationstechnik 7 Halbleiterbauelemente und Analytik 2

Institut für Festkörperforschung; IFF 7 Institut für Schicht- und Ionentechnik; ISI 2

1999

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