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Journal Article
Investigation of a hydrogen implantation-induced blistering phenomenon in Si0.70Ge0.30
Singh, R.
2011
Semiconductor science and technology, 26 (2011) S. 125001
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Christiansen, S.
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Grundlagen für zukünftige Informationstechnologien
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Halbleiter-Nanoelektronik; PGI-9
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