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1
IEEE transactions on electron devices, 65 (2018) 10, S. 4320 - 4325
...Nishi, Yoshifumi...
2
IEEE transactions on electron devices, 62 (2015) 5, S. 1561 - 1567
...Nishi, Yoshifumi...
3
IEEE electron device letters, 35 (2014) 2, S. 259 - 261
...Nishi, Yoshifumi...