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1

Journal Article

Current collapse and high-electric-field reliability of unpassivated GaN/AlGaN/GaN HEMTs

Meneghesso, G.
2006

IEEE Transactions on Electron Devices, 53 (2006) S. 2932 - 2941

“...Zanoni, E....”

2

Journal Article

Low current dispersion and low bias-stress degradation of unpassivated GaN/AlGaN/GaN/SiC HEMTs

Bernát, J.
2005

Physica status solidi / C, 2 (2005) S. 2676 - 2679

“...Zanoni, E....”

3

Conference Presentation

Low Current Dispersion and Low Bias-Stress Degradation of Unpassivated GaN/AlGaN/GaN/SiC HEMTs

Bernát, J.
2004

“...Zanoni, E....”

4

Conference Presentation

Unpassivated GaN/AlGaN/GaN HEMTs with very low DC to RF drain current dispersion

Pierobon, R.
2004

“...Zanoni, E....”

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