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Journal Article
Live Measurement of Electrical Charge Density in Materials using Off-Axis Electron Holography
Voelkl
,
E
.
2019
Microscopy and microanalysis, 25 (2019) S2, S. 44 - 45
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,
E
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Beleggia, M.
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Dunin-Borkowski, R. E.
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Migunov, Vadim
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Voelkl, E.
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Zheng, Fengshan
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Controlling Configuration-Based Phenomena
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Sources, Interaction with Matter, Detection and Analysis ofLow Energy Electrons 2
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Physik Nanoskaliger Systeme; ER-C-1
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2020
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