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Controlling Electron Charge-Based Phenomena
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Controlling Electron Charge-Based Phenomena
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Journal Article
Impact of Si cap, strain and temperature on the hole mobility of (s)Si/sSiGe/(s)SOI quantum-well p-MOSFETs
Yu, W.
2014
Microelectronic engineering, 113 (2014) S. 5 - 9
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Buca, Dan Mihai
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Chen, M.
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Hartmann, J.-M.
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Liu, C.
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Mantl, Siegfried
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Wu, W. R.
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Research Program
Controlling Electron Charge-Based Phenomena
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Halbleiter-Nanoelektronik; PGI-9
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2015
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