1
Measurement methods for the semiconductor device industry - a summary of NBS activity.
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Other Personal Name(s): “...Bullis, W. Murray....”
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Use of a time-shared computer system to control a Hall effect experiment /
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Other Personal Name(s): “...Bullis, W. Murray...”
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3
Methods of measurement for semiconductor materials, process control, and devices : quarterly report ; January 1 to March 31, 1969 /
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Other Personal Name(s): “...Bullis, W. Murray ;...”
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Measurement of carrier lifetime in semiconductors : an annotated bibliography covering the period 1949-1967 /
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Other Personal Name(s): “...Bullis, W. Murray...”
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