VLSI testing.
Saved in:
Personal Name(s): | Williams, T. W., editor |
---|---|
Imprint: |
Amsterdam :
North Holland,
1986.
|
Physical Description: |
IX, 275 S. |
Note: |
englisch |
ISBN: |
0444878904 9780444878953 0444878955 9780444878908 |
Series Title: |
Advances in CAD for VLSI ;
vol 0005. |
Keywords: |
VLSI : function test |
Classification: |
ZB | |
---|---|
Open Stacks ![]() ![]() |