VLSI testing.
Saved in:
| Personal Name(s): | Williams, T. W., editor |
|---|---|
| Imprint: |
Amsterdam :
North Holland,
1986.
|
| Physical Description: |
IX, 275 S. |
| Note: |
englisch |
| ISBN: |
0444878904 9780444878953 0444878955 9780444878908 |
| Series Title: |
Advances in CAD for VLSI ;
vol 0005. |
| Keywords: |
VLSI : function test |
| Classification: |
| ZB | |
|---|---|
Open Stacks  Call Number: B 059608'01'-005 Barcode: 1086003591
Available
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