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VLSI testing.

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Personal Name(s): Williams, T. W., editor
Imprint: Amsterdam : North Holland, 1986.
Physical Description: IX, 275 S.
Note: englisch
ISBN: 0444878904
9780444878953
0444878955
9780444878908
Series Title: Advances in CAD for VLSI ; vol 0005.
Keywords: VLSI : function test
Classification:
TBL - VLSI
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Open Stacks Call Number: B 059608'01'-005 Barcode: 1086003591 Available   

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