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Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends / A. Benninghoven, F. G. Rüdenauer, H. W. Werner

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Personal Name(s): Benninghoven, Alfred, author
Rüdenauer, Friedrich G., author / Werner, H. W., author
Imprint: New-York, NY : Wiley, 1987
Physical Description: XXXV, 1227 Seiten
Note: englisch
ISBN: 0471010561
9780471010562
Series Title: Chemical analysis ; 86
Subject (ZB):
SIMS (secondary ion mass spectroscopy)
Classification:
FGGJ - Ion beam analysis, ion beam solid interaction
Shelf Classification:
FGG - Ionenstrahltechnologie
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Institute Call Number: S 000328-0086'01' Barcode: 1088101631 Available   
Institute Call Number: S 000328-0086'01' Barcode: 1090104008 Available   
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