Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends / A benninghoven ; F. G. Rüdenauer ; H. W. Werner.
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| Personal Name(s): | Benninghoven, A. |
|---|---|
| Rüdenauer, F. G. / Werner, H. W. | |
| Imprint: |
New-York, NY :
Wiley,
1987.
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| Physical Description: |
XXXV, 1227 S. |
| Note: |
englisch |
| ISBN: |
0471010561 9780471010562 |
| Series Title: |
Chemical analysis ;
86. |
| Subject (ZB): | |
| Classification: | |
| Shelf Classification: |
| IBN-1-2 | |
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