Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends / A benninghoven ; F. G. Rüdenauer ; H. W. Werner.

Saved in:
Benninghoven, A.
Rüdenauer, F. G. / Werner, H. W.
New-York, NY : Wiley, 1987.
XXXV, 1227 S.
englisch
0471010561
9780471010562
Chemical analysis ; 86.

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