Scanning electron microscopy 1986,2 : An international journal of scanning electron microscopy, related techniques, and applications.
Saved in:
Personal Name(s): | Becker, R. P., editor |
---|---|
Imprint: |
AMF-O'Hare, IL :
Scanning Electron Microscopy,
1987.
|
Physical Description: |
X, S. 329-792, XI-XV. |
Note: |
englisch |
Series Title: |
Scanning electron microscopy ;
1986,2. |
Classification: |
ZB | |
---|---|
Open Stacks ![]() ![]() |