Scanning electron microscopy 1986,2 : An international journal of scanning electron microscopy, related techniques, and applications.
Saved in:
| Personal Name(s): | Becker, R. P., editor |
|---|---|
| Imprint: |
AMF-O'Hare, IL :
Scanning Electron Microscopy,
1987.
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| Physical Description: |
X, S. 329-792, XI-XV. |
| Note: |
englisch |
| Series Title: |
Scanning electron microscopy ;
1986,2. |
| Classification: |
| ZB | |
|---|---|
Open Stacks  Call Number: S 003531-1986,2'01' Barcode: 1088101233
Available
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