Scanning electron microscopy 1986,2 : An international journal of scanning electron microscopy, related techniques, and applications.

Saved in:
Becker, R. P., (editor)
AMF-O'Hare, IL : Scanning Electron Microscopy, 1987.
X, S. 329-792, XI-XV.
englisch
Scanning electron microscopy ; 1986,2.

ZB
Open Stacks Call Number: S 003531-1986,2'01' Barcode: 1088101233 Available