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Scanning electron microscopy 1986,2 : An international journal of scanning electron microscopy, related techniques, and applications.

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Personal Name(s): Becker, R. P., editor
Imprint: AMF-O'Hare, IL : Scanning Electron Microscopy, 1987.
Physical Description: X, S. 329-792, XI-XV.
Note: englisch
Series Title: Scanning electron microscopy ; 1986,2.
Classification:
FHJ - Scanning electron microscopy, analytical electron microscopy
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ZB
Open Stacks Call Number: S 003531-1986,2'01' Barcode: 1088101233 Available   

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