Atom probe field ion microscopy and its applications / T. Sakurai, A. Sakai, H. W. Pickering
Atom probe field ion microscopy (apfim) :
Saved in:
Personal Name(s): | Sakurai, T. |
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Sakai, A. / Pickering, H. W. | |
Imprint: |
Boston :
Academic Pr.,
1989
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Physical Description: |
VII, 299 S. |
Note: |
englisch |
ISBN: |
9780120145829 0120145820 |
Series Title: |
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Advances in electronics and electron physics. Supplement ;
20 |
Classification: | |
Shelf Classification: |
ZB | |
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