Atom probe field ion microscopy and its applications / T. Sakurai, A. Sakai, H. W. Pickering
Atom probe field ion microscopy (apfim) :
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| Personal Name(s): | Sakurai, T. |
|---|---|
| Sakai, A. / Pickering, H. W. | |
| Imprint: |
Boston :
Academic Pr.,
1989
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| Physical Description: |
VII, 299 S. |
| Note: |
englisch |
| ISBN: |
9780120145829 0120145820 |
| Series Title: |
Advances in electronics and electron physics. Supplement ;
20 |
| Classification: | |
| Shelf Classification: |
| ZB | |
|---|---|
Reading Room  Call Number: FHE 026 Barcode: 1089103837
Available
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