Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
Saved in:
| Personal Name(s): | Siegel, Benjamin M. |
|---|---|
| Beaman, Donald Robert. | |
| Imprint: |
New York :
Wiley,
1975.
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| Physical Description: |
xiii, 474 p. |
| Note: |
Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973 "A Wiley biomedical-health publication." englisch |
| ISBN: |
9780471790204 0471790206 |
| Keywords: |
electron microscopy : resolution : application conference united states : electron microscopy |
| Subject (ZB): | |
| Classification: |
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Open Stacks  Call Number: B 041241'01' Barcode: 1075004555
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