Ion spectroscopies for surface analysis / ed. by A. W. Czanderna ...

Personal Name(s):	Czanderna, Alvin Warren, editor
Imprint:	New-York, NY : Plenum Pr., 1991
Physical Description:	XVII, 469 S.
Note:	englisch
ISBN:	0306437929 9780306437922 9780306437929
Series Title:	Methods of surface characterization ; 2
Keywords:	overview of ion spectroscopies for surface compositional analysis surface structure and reaction studies by ion/solid collisions particle induced desorption ionization techniques for organic mass spectrometry laser resonant and nonresonant photoionization of sputtered neutrals Rutherford backscattering and nuclear reaction analysis ion scattering spectroscopy comparison of SIMS, SNMS, ISS, RBS, AES and XPS methods for surface compositional analysis appendix: tables
Subject (ZB):	ion beam analysis
Classification:	FGGJ - Ion beam analysis, ion beam solid interaction
Shelf Classification:	FGG - Ionenstrahltechnologie