Ion spectroscopies for surface analysis / ed. by A. W. Czanderna ...
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Personal Name(s): | Czanderna, Alvin Warren, editor |
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Imprint: |
New-York, NY :
Plenum Pr.,
1991
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Physical Description: |
XVII, 469 S. |
Note: |
englisch |
ISBN: |
0306437929 9780306437922 9780306437929 |
Series Title: |
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Methods of surface characterization ;
2 |
Keywords: |
overview of ion spectroscopies for surface compositional analysis surface structure and reaction studies by ion/solid collisions particle induced desorption ionization techniques for organic mass spectrometry laser resonant and nonresonant photoionization of sputtered neutrals Rutherford backscattering and nuclear reaction analysis ion scattering spectroscopy comparison of SIMS, SNMS, ISS, RBS, AES and XPS methods for surface compositional analysis appendix: tables |
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