Characterization of materials. 2.

Personal Name(s):	Lifshin, E,, editor
Imprint:	Weinheim : VCH Verl. Ges., 1994.
Physical Description:	775 S.
Note:	englisch
ISBN:	9783527282654 3527282653 9781560811282 1560811285
Series Title:	Materials science and technology ; 2B.
Keywords:	nanoscale characterization of surfaces and interfaces mechanical spectroscopy scanning Auger microscopy quantitative acoustic microscopy quantitative description of microstructures by image analysis electron microprobe analysis high energy ion beam analysis techniques field ion microscopy and atom probe analysis neutron diffraction small angle scattering of x-rays and neutrons characterization of surfaces, interfaces, and thin films of organic materials
Subject (ZB):	materials characterization solid state spectroscopy microscopy surface analysis electron microprobe analysis ion beam analysis ion microscopy neutron diffraction small angle scattering
Classification:	FHA - Materials characterization - general aspects FAF - Materials research - comprehensive works
Shelf Classification:	FAF - Materialforschung - allgemeine Serien