Characterization of materials. 2.
Saved in:
Personal Name(s): | Lifshin, E,, editor |
---|---|
Imprint: |
Weinheim :
VCH Verl. Ges.,
1994.
|
Physical Description: |
775 S. |
Note: |
englisch |
ISBN: |
9783527282654 3527282653 9781560811282 1560811285 |
Series Title: |
/* Depending on the record driver, $field may either be an array with
"name" and "number" keys or a flat string containing only the series
name. We should account for both cases to maximize compatibility. */?>
Materials science and technology ;
2B. |
Keywords: |
nanoscale characterization of surfaces and interfaces mechanical spectroscopy scanning Auger microscopy quantitative acoustic microscopy quantitative description of microstructures by image analysis electron microprobe analysis high energy ion beam analysis techniques field ion microscopy and atom probe analysis neutron diffraction small angle scattering of x-rays and neutrons characterization of surfaces, interfaces, and thin films of organic materials |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
ZB | |
---|---|
Reading Room Call number: FAF 001-02B Barcode: 1094100195 Available |