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Metal impurities in silicon-device fabrication.

Metal impurities in silicon device fabrication :

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Personal Name(s): Graff, Klaus.
Imprint: Berlin : Springer, 1995.
Physical Description: IX, 216 S.
Note: englisch
ISBN: 9780387583174
0387583173
9783540583172
3540583173
Series Title: Springer series in materials science ; 24.
Subject (ZB):
semiconductor
silicon
crystal defect
impurity
semiconductor device
fabrication
Classification:
FJHE - Defects and radiation effects in semiconductors
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Open Stacks Call Number: S 005950-0024'01' Barcode: 1094104385 Available   

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