Optical characterization of real surfaces and films.
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| Personal Name(s): | Vedam, K., editor |
|---|---|
| Imprint: |
San-Diego, CA :
Academic Pr.,
1994.
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| Physical Description: |
XV, 328 S. |
| Note: |
englisch |
| ISBN: |
9780125330190 0125330197 |
| Series Title: |
Physics of thin films ;
19. |
| Keywords: |
in situ studies of crystalline semiconductor surfaces by reflectance anisotropy real- time spectroscopic ellipsometric studies of the nucleation, growth, and optical functions of thin films part 1: tetrahedrally bonded materials real- time spectroscopic ellipsometric studies of the nucleation, growth, and optical functions of thin films part 1: aluminum optical characterization of inhomogeneous transparent films on transparent substrates by spectroscopic ellipsometry characterization of ferroelectric films by spectroscopic ellipsometry effects of optical anisotropy on spectro- ellipsometric data for thin films and surfaces |
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Reading Room  Call Number: FFP 001-19 Barcode: 1095100608
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