Energy filtering transmission electron microscopy.
Saved in:
Personal Name(s): | Reimer, L., editor |
---|---|
Deininger, C., Mitarb. | |
Imprint: |
Berlin :
Springer,
1995.
|
Physical Description: |
XI, 424 S. |
Note: |
englisch |
ISBN: |
354058479X 9783540584797 |
Series Title: |
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Springer series in optical sciences ;
vol 0071. |
Subject (ZB): | |
Classification: |
LEADER | 01087nam a2200325 n 4500 | ||
---|---|---|---|
001 | 142851 | ||
005 | 20041208082600.0 | ||
008 | r1995 | ||
020 | |a 354058479X | ||
035 | |a (Sirsi) a126947 | ||
084 | 0 | |a FHJ - Scanning electron microscopy, analytical electron microscopy |2 ZB | |
245 | 0 | 0 | |a Energy filtering transmission electron microscopy. |
260 | |a Berlin : |b Springer, |c 1995. | ||
300 | |a XI, 424 S. | ||
490 | 0 | |a Springer series in optical sciences ; |v vol 0071. | |
500 | |a englisch | ||
596 | |a 1 | ||
650 | 4 | |a energy | |
650 | 4 | |a transmission electron microscopy | |
650 | 4 | |a electron optics | |
650 | 4 | |a imaging technique | |
650 | 4 | |a plasmon | |
650 | 4 | |a electron energy loss spectroscopy | |
650 | 4 | |a electron spectroscopy | |
650 | 4 | |a reflection spectroscopy | |
700 | 1 | |a Reimer, L., |e Hrsg. | |
700 | 1 | |a Deininger, C., |e Mitarb. | |
900 | |a S 003454-0071'01' | ||
908 | |a Monographie, Sammelwerk | ||
949 | |a S 003454-0071'01' |w LC |c 1 |i 1095102537 |d 11/5/2015 |e 9/3/2015 |l STACKS |m ZB |n 24 |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |