Atom probe field ion microscopy.
Saved in:
Personal Name(s): | Miller, M. K., Mitarb. |
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Imprint: |
Oxford :
Clarendon Pr.,
1996.
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Physical Description: |
XI, 509 S. |
Note: |
englisch |
ISBN: |
9780198513872 0198513879 |
Series Title: |
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Monographs on the physics and chemistry of materials ;
vol 0052. |
Keywords: |
image interpretation atom probe instrumentation atom probe data - statistical analysis metallurgical applications |
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