Atom probe field ion microscopy.
Saved in:
Personal Name(s): | Miller, M. K., Mitarb. |
---|---|
Imprint: |
Oxford :
Clarendon Pr.,
1996.
|
Physical Description: |
XI, 509 S. |
Note: |
englisch |
ISBN: |
9780198513872 0198513879 |
Series Title: |
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Monographs on the physics and chemistry of materials ;
vol 0052. |
Keywords: |
image interpretation atom probe instrumentation atom probe data - statistical analysis metallurgical applications |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
LEADER | 01277nam a2200361 n 4500 | ||
---|---|---|---|
001 | 144200 | ||
005 | 19970520000000.0 | ||
008 | r1996 | ||
020 | |a 0198513879 | ||
035 | |a (Sirsi) a128133 | ||
084 | 0 | |a FHEH - Ion microscopy |2 ZB | |
084 | 0 | |a FFGH - Electron emission, field emission |2 ZB | |
084 | 1 | |a FHE - Bildgebende Verfahren in der Materialcharakterisierung |2 LS | |
245 | 0 | 0 | |a Atom probe field ion microscopy. |
260 | |a Oxford : |b Clarendon Pr., |c 1996. | ||
300 | |a XI, 509 S. | ||
490 | 0 | |a Monographs on the physics and chemistry of materials ; |v vol 0052. | |
500 | |a englisch | ||
596 | |a 1 | ||
650 | 4 | |a atom probe field ion microscopy | |
650 | 4 | |a nonmetal | |
650 | 4 | |a thin film | |
650 | 4 | |a surface | |
653 | |a image interpretation | ||
653 | |a atom probe instrumentation | ||
653 | |a atom probe data - statistical analysis | ||
653 | |a metallurgical applications | ||
700 | 1 | |a Miller, M. K., |e Mitarb. | |
900 | |a S 005130-0052'01' | ||
900 | |a FHE 017 | ||
908 | |a Monographie, Sammelwerk | ||
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949 | |a S 005130-0052'01' |w LC |c 1 |i 1096103022 |l STACKS |m ZB |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |