Handbuch Festkörperanalyse mit Elektronen, Ionen und Röntgenstrahlen / Hrsg. Otto Brümmer ...
Saved in:
Personal Name(s): | Brümmer, Otto, editor |
---|---|
Imprint: |
Braunschweig, Wiesbaden :
Vieweg,
1980.
|
Physical Description: |
432 S. |
Note: |
deutsch |
ISBN: |
3528083980 9783528083984 |
Keywords: |
x-ray diffraction x-ray topography x-ray fluorescence analysis electron microprobe analysis high resolution x-ray spectroscopy solid state analysis by ion induced x-ray emission high energy electron diffraction (HEED) low energy electron diffraction (LEED) transmission electron microscopy (TEM) scanning electron miroscopy field emission microscopy electron energy loss spectroscopy (EELS) Auger electron spectroscopy (AES) photoelectron spectroscopy (PES) ion induced electron emission ion scattering spectroscopy (ISS) ionometry (channeling, Rutherford backscattering) secondary ion mass spectroscopy (SIMS) electron stimulated ion desorption |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
LEADER | 02148cam a2200529 n 4500 | ||
---|---|---|---|
001 | 3413 | ||
005 | 19970526000000.0 | ||
008 | r1980 | ||
020 | |a 3528083980 | ||
035 | |a (Sirsi) a13292 | ||
084 | 0 | |a FHA - Materials characterization - general aspects |2 ZB | |
084 | 0 | |a FHAB - Surface and thin film characterization |2 ZB | |
084 | 0 | |a FGGJ - Ion beam analysis, ion beam solid interaction |2 ZB | |
084 | 0 | |a FHGE - Electron diffraction |2 ZB | |
084 | 0 | |a FHEE - X-ray microscopy, surface topography |2 ZB | |
084 | 1 | |a FHA - Materialcharakterisierung |2 LS | |
245 | 0 | 0 | |a Handbuch Festkörperanalyse mit Elektronen, Ionen und Röntgenstrahlen / |c Hrsg. Otto Brümmer ... |
260 | |a Braunschweig, |a Wiesbaden : |b Vieweg, |c 1980. | ||
300 | |a 432 S. | ||
500 | |a deutsch | ||
596 | |a 1 26 | ||
650 | 4 | |a electron diffraction | |
653 | |a x-ray diffraction | ||
653 | |a x-ray topography | ||
653 | |a x-ray fluorescence analysis | ||
653 | |a electron microprobe analysis | ||
653 | |a high resolution x-ray spectroscopy | ||
653 | |a solid state analysis by ion induced x-ray emission | ||
653 | |a high energy electron diffraction (HEED) | ||
653 | |a low energy electron diffraction (LEED) | ||
653 | |a transmission electron microscopy (TEM) | ||
653 | |a scanning electron miroscopy | ||
653 | |a field emission microscopy | ||
653 | |a electron energy loss spectroscopy (EELS) | ||
653 | |a Auger electron spectroscopy (AES) | ||
653 | |a photoelectron spectroscopy (PES) | ||
653 | |a ion induced electron emission | ||
653 | |a ion scattering spectroscopy (ISS) | ||
653 | |a ionometry (channeling, Rutherford backscattering) | ||
653 | |a secondary ion mass spectroscopy (SIMS) | ||
653 | |a electron stimulated ion desorption | ||
700 | 1 | |a Brümmer, Otto, |e Hrsg. | |
900 | |a B 049945'01' | ||
900 | |a FHA 005 | ||
908 | |a Monographie, Sammelwerk | ||
949 | |a B 049945'01' |w LC |c 1 |i 1080004110 |d 3/11/1999 |l STACKS |m IFF |r Y |s Y |t INSTB |u 25/3/2009 |x INST-F |1 PRINT | ||
949 | |a FHA 005 |w LC |c 1 |i 1080003513 |d 12/5/2011 |e 11/4/2011 |l STACKS |m ZB |n 2 |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |