Surface and thin film analysis : principles, instrumentation, applications / ed. by H. Bubert ...
Saved in:
Table of Contents |
|
Personal Name(s): | Bubert, Henning, editor |
Imprint: |
Weinheim :
Wiley-VCH,
2002.
|
Physical Description: |
V, 336 S. |
Note: |
englisch |
ISBN: |
3527304584 9783527304585 |
Keywords: |
electron detection ion detection photon detection scanning probe microscopy |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
LEADER | 01337cam a2200337 n 4500 | ||
---|---|---|---|
001 | 195787 | ||
005 | 20080211122700.0 | ||
008 | r2002 | ||
020 | |a 3527304584 | ||
035 | |a (Sirsi) a160196 | ||
084 | 0 | |a FHAB - Surface and thin film characterization |2 ZB | |
084 | 1 | |a FHA - Materialcharakterisierung |2 LS | |
245 | 0 | 0 | |a Surface and thin film analysis : |b principles, instrumentation, applications / |c ed. by H. Bubert ... |
260 | |a Weinheim : |b Wiley-VCH, |c 2002. | ||
300 | |a V, 336 S. | ||
500 | |a englisch | ||
596 | |a 1 10 | ||
650 | 4 | |a materials characterization | |
650 | 4 | |a surface analysis | |
650 | 4 | |a thin film | |
653 | |a electron detection | ||
653 | |a ion detection | ||
653 | |a photon detection | ||
653 | |a scanning probe microscopy | ||
700 | 1 | |a Bubert, Henning, |e Hrsg. | |
856 | |u http://wwwzb.fz-juelich.de/contentenrichment/inhaltsverzeichnisse/bis2009/ISBN-3-527-30458-4.pdf |z Inhaltsverzeichnis | ||
900 | |a FHA 043 | ||
900 | |a B 085362'01' | ||
908 | |a Monographie, Sammelwerk | ||
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