Accelerated testing : statistical models, test plans, and data analyses / Wayne Nelson.
Saved in:
Table of Contents |
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Personal Name(s): | Nelson, Wayne. |
Imprint: |
New York, NY :
Wiley,
2004.
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Physical Description: |
XIV, 601 S. |
Note: |
englisch |
ISBN: |
9780471697367 0471697362 |
Keywords: |
Failure time data analysis |
Subject (ZB): | |
Classification: |
IEK-1 | |
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Institute Call number: B 093123'01' Barcode: 1209100793 Checked Out Place a Hold | |
IEK-3 | |
Institute Call number: B 093123'01' Barcode: 1208101636 Available |