"Fundamentals of nanoscale film analysis [E-Book] / Terry L. Alford, Leonard C. Feldman, James W. Mayer"
Saved in:
Full text |
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Personal Name(s): | Alford, Terry L., author |
Feldman, Leonard C., author / Mayer, James W., author | |
Imprint: |
Boston, MA :
Springer,
2007
|
ISBN: |
9780387292601 |
Keywords: |
Surfaces (Physics) Nanotechnology Particles (Nuclear physics) Condensed matter Electronics Chemistry Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Nanotechnology Solid State Physics and Spectroscopy Condensed Matter Electronics and Microelectronics, Instrumentation |
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653 | |a Nanotechnology | ||
653 | |a Particles (Nuclear physics) | ||
653 | |a Condensed matter | ||
653 | |a Electronics | ||
653 | |a Chemistry | ||
653 | |a Characterization and Evaluation of Materials | ||
653 | |a Surfaces and Interfaces, Thin Films | ||
653 | |a Nanotechnology | ||
653 | |a Solid State Physics and Spectroscopy | ||
653 | |a Condensed Matter | ||
653 | |a Electronics and Microelectronics, Instrumentation | ||
700 | |a Feldman, Leonard C., |e Verfasser | ||
700 | |a Mayer, James W., |e Verfasser | ||
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