Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching [E-Book] : application to rough and natural surfaces / Gerd Kaupp.
Saved in:
Full text |
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Personal Name(s): | Kaupp, Gerd. |
Imprint: |
Berlin :
Springer,
2006
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ISBN: |
9783540284055 |
Keywords: |
Chemistry Nanotechnology Physics and Applied Physics in Engineering Applied Optics, Optoelectronics, Optical Devices Medical Biochemistry Physical Chemistry Life Sciences, general |
Subject (ZB): |
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245 | 0 | 0 | |a Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching |h [E-Book] : |b application to rough and natural surfaces / |c Gerd Kaupp. |
260 | |a Berlin : |b Springer, |c 2006 |e (Springer LINK) | ||
596 | |a 1 | ||
650 | 4 | |a force microscopy | |
650 | 4 | |a scanning probe microscopy | |
653 | |a Chemistry | ||
653 | |a Nanotechnology | ||
653 | |a Physics and Applied Physics in Engineering | ||
653 | |a Applied Optics, Optoelectronics, Optical Devices | ||
653 | |a Medical Biochemistry | ||
653 | |a Physical Chemistry | ||
653 | |a Life Sciences, general | ||
700 | 1 | |a Kaupp, Gerd. | |
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