Lock-in thermography : basics and use for evaluating electronic devices and materials [E-Book] / O. Breitenstein ; W. Warta ; M. Langenkamp
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Full text Table of Contents |
|
Personal Name(s): | Breitenstein, O. |
Warta, W. / Langenkamp, M. | |
Edition: |
2nd ed. |
Imprint: |
Heidelberg :
Springer,
2010
|
Physical Description: |
X, 255 S. |
Note: |
englisch |
ISBN: |
9783642024177 |
Series Title: |
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Springer series in advanced microelectronics ;
10 |
Subject (ZB): | |
Classification: |
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---|---|---|---|
008 | 100120n 000 0 eng u | ||
020 | |a 9783642024177 | ||
035 | |a (Sirsi) a258055 | ||
041 | |a eng | ||
084 | 0 | |a FPN - Nondestructive testing | |
245 | |a Lock-in thermography : |b basics and use for evaluating electronic devices and materials |h [E-Book] / |c O. Breitenstein ; W. Warta ; M. Langenkamp | ||
250 | |a 2nd ed. | ||
260 | |a Heidelberg : |b Springer, |c 2010 |e (Springer LINK) | ||
300 | |a X, 255 S. | ||
490 | |a Springer series in advanced microelectronics ; |v 10 | ||
500 | |a englisch | ||
650 | 4 | |a thermography | |
650 | 4 | |a nondestructive testing | |
700 | |a Breitenstein, O. | ||
700 | |a Warta, W. | ||
700 | |a Langenkamp, M. | ||
596 | |a 1 | ||
856 | |u http://dx.doi.org/10.1007/978-3-642-02417-7 |z Volltext | ||
856 | |u http://wwwzb.fz-juelich.de/contentenrichment/inhaltsverzeichnisse/2010/9783642024160.pdf |z Inhaltsverzeichnis | ||
908 | |a Monographie, Sammelwerk | ||
915 | |a zzwFZJ3 | ||
932 | |a Engineering (Springer-11647) | ||
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