Characterization of materials [E-Book] / ed. by Elton N. Kaufmann
Kaufmann, Elton N., ( Hrsg.)
2. Aufl.
Chichester : Wiley, 2012
englisch
9780471266969
10.1002/0471266965
General Vacuum Techniques ; X-Ray Powder Diffraction ; High Strain Rate Testing ; Deep Level Transient Spectroscopy ; Cyclic Voltammetry ; Extended X-Ray Absorption Fine Structure ; Low Energy Electron Diffraction ; Thermogravimetric Analysis ; Magnetometry ; Transmission Electron Microscopy ; Ultraviolet Photoelectron Spectroscopy
Full Text
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245 |a Characterization of materials   |h [E-Book] /   |c  ed. by Elton N. Kaufmann 
250 |a 2. Aufl. 
260 |a Chichester :   |b Wiley,   |c 2012  |e (WileyOnline) 
500 |a englisch 
506 |a lizenziert für das Forschungszentrum Jülich 
520 |a This new second edition with a foreword by condensed-matter physicist, educator, and scientific community leader, Dr. Shirley Jackson,President of Rensselaer Polytechnic Institute (RPI),is thoroughly updated and expanded to cover the field’s many advances over the decade since the first edition appeared. It covers materials characterization techniques ranging from the more mature mechanical, thermal and electrical testing methods to those state-of-the-art beam-based methods employed at large scientific user facilities around the world. The ever increasing role of computation to predict and understand materials properties is supported by an updated chapter on computational and theoretical methods as well. First published in 2003, Characterization of Materials quickly established itself as a leading reference among professionals who wanted a concise but comprehensive guide to finding the best characterization technique for the project at hand. With this second edition, you also get the latest on advances in instrumentation, techniques and analysis. More powerful characterization tools have arisen in many areas including all forms of scanning probe microscopes, more powerful x-ray sources, a completely new generation of electron microscopes, improved ways of using neutrons and neutron polarization, and far more robust computing power for modeling and simulation. Several articles reveal how these improved tools enabled characterization of entirely new types of materials, including nano-materials from quantum dots to nano-photonics to nano-composites, studies of spintronics- and quantum-computing-related systems, and the extension of materials characterization techniques into areas that blur the boundaries between physics, chemistry and biology, just to name a few. 
650 4 |a materials characterization 
650 4 |a thermal analysis 
650 4 |a spectroscopy 
650 4 |a voltammetry 
650 4 |a gravimetry 
650 4 |a X-ray powder diffraction 
653 |a General Vacuum Techniques ; X-Ray Powder Diffraction ; High Strain Rate Testing ; Deep Level Transient Spectroscopy ; Cyclic Voltammetry ; Extended X-Ray Absorption Fine Structure ; Low Energy Electron Diffraction ; Thermogravimetric Analysis ; Magnetometry ; Transmission Electron Microscopy ; Ultraviolet Photoelectron Spectroscopy 
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