EMAG micro. 1989 : Institute of Physics Electron Microscopy and Analysis Group and Royal Microscopical Society conference: proceedings. vol 0001: physical : London, 13.09.89-15.09.89.
electron microscopy and electron beam analysis
Saved in:
Personal Name(s): | Goodhew, Peter J., editor |
---|---|
Imprint: |
Bristol :
Institute of Physics,
1990.
|
Physical Description: |
XIV, 570 S. |
Note: |
englisch |
ISBN: |
9780854980628 0854980628 |
Series Title: |
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Institute of Physics conference series ;
vol 0098,01. |
Keywords: |
scanning tunneling microscopy (STM) and surface microscopy electron energy loss spectroscopy (EELS), parallel recording in TEM electron diffraction techniques field ion, pulsed laser and acoustic microscopy techniques electron microscopy of metallic materials electron microscopy of nanostructures, electron radiation damage and low dose techniques Auger electron spectroscopy (AES), electron reflection techniques and microanalysis applications high resolution electron microscopy (HREM) electron microscopy of nonmetallic materials scanning electron microscopy electron microscopy of semiconductors developments in electron microscopy instrumentation |
Subject (ZB): | |
Classification: |
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---|---|---|---|
001 | 52131 | ||
005 | 19980615000000.0 | ||
008 | r1990 | ||
020 | |a 0854980628 | ||
035 | |a (Sirsi) a50446 | ||
084 | 0 | |a FHG - Electron microscopy |2 ZB | |
084 | 0 | |a FHJ - Scanning electron microscopy, analytical electron microscopy |2 ZB | |
245 | 0 | 0 | |a EMAG micro. 1989 : |b Institute of Physics Electron Microscopy and Analysis Group and Royal Microscopical Society conference: proceedings. vol 0001: physical : London, 13.09.89-15.09.89. |
260 | |a Bristol : |b Institute of Physics, |c 1990. | ||
300 | |a XIV, 570 S. | ||
490 | 0 | |a Institute of Physics conference series ; |v vol 0098,01. | |
500 | |a englisch | ||
520 | |a electron microscopy and electron beam analysis | ||
596 | |a 1 | ||
650 | 4 | |a electron microscopy | |
653 | |a scanning tunneling microscopy (STM) and surface microscopy | ||
653 | |a electron energy loss spectroscopy (EELS), parallel recording in TEM | ||
653 | |a electron diffraction techniques | ||
653 | |a field ion, pulsed laser and acoustic microscopy techniques | ||
653 | |a electron microscopy of metallic materials | ||
653 | |a electron microscopy of nanostructures, electron radiation damage and low dose techniques | ||
653 | |a Auger electron spectroscopy (AES), electron reflection techniques and microanalysis applications | ||
653 | |a high resolution electron microscopy (HREM) | ||
653 | |a electron microscopy of nonmetallic materials | ||
653 | |a scanning electron microscopy | ||
653 | |a electron microscopy of semiconductors | ||
653 | |a developments in electron microscopy instrumentation | ||
700 | 1 | |a Goodhew, Peter J., |e Hrsg. | |
710 | 2 | |a Institute of Physics (London) |b Electron Microscopy and Analysis Group. | |
710 | 2 | |a Royal Microscopical Society. | |
900 | |a S 001069-0098,01'01' | ||
908 | |a Konferenz | ||
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