Scanning electron microscopy. 1983,2 : Dearborn, MI, 17.04.1983-22.04.1983 : An international journal of scanning electron microscopy, related techniques, and applications.
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Personal Name(s): | Johari, O., editor |
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AMF-O'Hare, IL :
Scanning Electron Microscopy,
1983.
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Physical Description: |
XIV, S. 467-995. |
Note: |
englisch |
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Scanning electron microscopy ;
1983,2. |
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ZB | |
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Open Stacks Call number: S 003531-1983,2'01' Barcode: 1084004720 Available |