X-ray microscopy and X-ray microanalysis: international symposium 0002: proceedings : Stockholm, 02.60.
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Personal Name(s): | Engstroem, A., editor |
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Imprint: |
Amsterdam :
Elsevier,
1960.
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Physical Description: |
X, 542 S. |
Note: |
englisch |
Series Title: |
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X-ray microscopy and X-ray microanalysis: international symposium ;
0002. |
Classification: |
ZB | |
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Open Stacks Call number: S 001158-0002'01' Barcode: 1062005460 Available |