Scanning electron microscopy. 1978,1 : Los-Angeles, CA, 17.04.1978-21.04.1978 : An international review of advances in instrumentation, techniques, theory and physical applications of the scanning electron microscope.
Saved in:
Personal Name(s): | Johari, O., editor |
---|---|
Imprint: |
AMF-O'Hare, IL :
Scanning Electron Microscopy,
1978.
|
Physical Description: |
XIV, 898 S. |
Note: |
englisch |
ISBN: |
0931288010 0931288002 9780931288029 9780931288005 0931288029 9780931288012 |
Series Title: |
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Scanning electron microscopy ;
1978,1. |
Keywords: |
scanning electron microscopy : conference united states scanning electron microscopy : materials science |
Classification: |
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020 | |a 0931288002 | ||
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084 | 0 | |a FHJ - Scanning electron microscopy, analytical electron microscopy |2 ZB | |
245 | 0 | 0 | |a Scanning electron microscopy. 1978,1 : |b Los-Angeles, CA, 17.04.1978-21.04.1978 : An international review of advances in instrumentation, techniques, theory and physical applications of the scanning electron microscope. |
260 | |a AMF-O'Hare, IL : |b Scanning Electron Microscopy, |c 1978. | ||
300 | |a XIV, 898 S. | ||
490 | 0 | |a Scanning electron microscopy ; |v 1978,1. | |
500 | |a englisch | ||
596 | |a 1 | ||
653 | |a scanning electron microscopy : conference united states | ||
653 | |a scanning electron microscopy : materials science | ||
700 | 1 | |a Johari, O., |e Hrsg. | |
900 | |a S 003531-1978,1'01' | ||
908 | |a Konferenz | ||
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