Scanning electron microscopy. 1981,2 : Dallas, TX, 14.04.1981-18.04.1981 : an international journal of scanning electron microscopy, related techniques, and applications.
Saved in:
Personal Name(s): | Johari, O., editor |
---|---|
Imprint: |
AMF-O'Hare, IL :
Scanning Electron Microscopy,
1981.
|
Physical Description: |
XI, 516 S. |
Note: |
englisch |
ISBN: |
0931288185 9780931288180 0931288215 9780931288210 |
Series Title: |
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Scanning electron microscopy ;
1981,2. |
Keywords: |
scanning electron microscopy : conference united states |
Classification: |
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084 | 0 | |a FHJ - Scanning electron microscopy, analytical electron microscopy |2 ZB | |
245 | 0 | 0 | |a Scanning electron microscopy. |n 1981,2 : |b Dallas, TX, 14.04.1981-18.04.1981 : an international journal of scanning electron microscopy, related techniques, and applications. |
260 | |a AMF-O'Hare, IL : |b Scanning Electron Microscopy, |c 1981. | ||
300 | |a XI, 516 S. | ||
490 | 0 | |a Scanning electron microscopy ; |v 1981,2. | |
500 | |a englisch | ||
596 | |a 1 | ||
653 | |a scanning electron microscopy : conference united states | ||
700 | 1 | |a Johari, O., |e Hrsg. | |
900 | |a S 003531-1981,2'01' | ||
908 | |a Konferenz | ||
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