Scanning Microscopy for Nanotechnology [E-Book] : Techniques and Applications / edited by Weilie Zhou, Zhong Lin Wang.
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnol...
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Full text |
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Personal Name(s): | Wang, Zhong Lin. editor |
Zhou, Weilie. editor | |
Imprint: |
New York, NY :
Springer New York,
2007
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Physical Description: |
XIV, 522 p. 399 illus. online resource. |
Note: |
englisch |
ISBN: |
9780387396200 |
DOI: |
10.1007/978-0-387-39620-0 |
Subject (LOC): |
- Fundamentals of Scanning Electron Microscopy (SEM)
- Backscattering Detector and EBSD in Nanomaterials Characterization
- X-ray Microanalysis in Nanomaterials
- Low kV Scanning Electron Microscopy
- E-beam Nanolithography Integrated with Scanning Electron Microscope
- Scanning Transmission Electron Microscopy for Nanostructure Characterization
- to In-Situ Nanomanipulation for Nanomaterials Engineering
- Applications of FIB and DualBeam for Nanofabrication
- Nanowires and Carbon Nanotubes
- Photonic Crystals and Devices
- Nanoparticles and Colloidal Self-assembly
- Nano-building Blocks Fabricated through Templates
- One-dimensional Wurtzite Semiconducting Nanostructures
- Bio-inspired Nanomaterials
- Cryo-Temperature Stages in Nanostructural Research.