Characterization of Crystal Growth Defects by X-Ray Methods [E-Book] / edited by Brian K. Tanner, D. Keith Bowen.
This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silico...
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Full text |
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Personal Name(s): | Bowen, D. Keith, editor |
Tanner, Brian K., editor | |
Imprint: |
Boston, MA :
Springer,
1980
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Physical Description: |
XXVI, 589 p. 556 illus. online resource. |
Note: |
englisch |
ISBN: |
9781475711264 |
DOI: |
10.1007/978-1-4757-1126-4 |
Series Title: |
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Nato Advanced Study Institutes Series, Series B. Physics ;
63 |
Subject (LOC): |
- 1 Industrial Implications of Crystal Quality
- 2 The Technical Importance of Growth Defects
- 3 Defects and their Detectability in Melt-Grown Crystals
- 4 Defects and Their Detectability
- 5 Defect Generation in Metal Crystals
- 6 Defects in Non-metal Crystals
- 7 Defect Visualisation: Individual Defects
- 8 Experimental Techniques for the Study of Statistically Distributed Defects
- 9 Elementary Dynamical Theory
- 10 Perfect and Imperfect Crystals
- 11 X-ray Sources
- 12 X-ray Detectors
- 13 Sample Preparation
- 14 Laboratory Techniques for X-ray Reflection Topography
- 15 Laboratory Techniques for Transmission X-ray Topography
- 16 White Beam Synchrotron Radiation Topography
- 17 Control of Wavelength, Polarization, Time-Structure and Divergence for Synchrotron Radiation Topography
- 18 Monochromatic Synchrotron Radiation Topography
- 19 Environmental Stages and Dynamic Experiments
- 20 Technology and Costs of X-Ray Diffraction Topography
- 21 X-Ray TV Imaging and Real-Time Experiments +
- 22 Computer Modelling of Crystal Growth and Dissolution
- 23 Microradiography and Absorption Microscopy
- 24 Reciprocal Lattice Spike Topography
- 25 Reflection Topography: Panel Discussion
- Appendix I Designing a Topographic Experiment
- Appendix 2 Defects and Artifacts
- Appendix 3 Exercises in Diffraction Contrast
- Appendix 4 Stereographic Projection Description for X-Ray Topography: Subgrain Boundaries and Stereo-Pairs
- Appendix 5 Dispersion Surface Exercises
- Appendix 6 Contrast of Stacking Faults
- Appendix 7 Misfit Boundaries and Junctions of Purely Rotational Boundaries
- Sponsors, Organising Committee, Advisory Panel
- Chemical Formula Index.