This title appears in the Scientific Report :
2015
Please use the identifier:
http://hdl.handle.net/2128/9749 in citations.
Please use the identifier: http://dx.doi.org/10.1103/PhysRevLett.115.026101 in citations.
Scanning Quantum Dot Microscopy
Scanning Quantum Dot Microscopy
We introduce a scanning probe technique that enables three-dimensional imaging of local electrostatic potential fields with subnanometer resolution. Registering single electron charging events of a molecular quantum dot attached to the tip of an atomic force microscope operated at 5 K, equipped with...
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Personal Name(s): | Wagner, Christian (Corresponding author) |
---|---|
Green, Matthew F. B. / Leinen, Philipp / Deilmann, Thorsten / Krüger, Peter / Rohlfing, Michael / Temirov, Ruslan (Corresponding author) / Tautz, Frank Stefan | |
Contributing Institute: |
John von Neumann - Institut für Computing; NIC JARA-FIT; JARA-FIT Quantum Nanoscience; PGI-3 |
Published in: | Physical review letters, 115 (2015) 2, S. 026101 |
Imprint: |
College Park, Md.
APS
2015
|
DOI: |
10.1103/PhysRevLett.115.026101 |
Document Type: |
Journal Article |
Research Program: |
Spectra of 2D layered materials Controlling Electron Charge-Based Phenomena |
Link: |
OpenAccess OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://dx.doi.org/10.1103/PhysRevLett.115.026101 in citations.
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520 | |a We introduce a scanning probe technique that enables three-dimensional imaging of local electrostatic potential fields with subnanometer resolution. Registering single electron charging events of a molecular quantum dot attached to the tip of an atomic force microscope operated at 5 K, equipped with a qPlus tuning fork, we image the quadrupole field of a single molecule. To demonstrate quantitative measurements, we investigate the dipole field of a single metal adatom adsorbed on a metal surface. We show that because of its high sensitivity the technique can probe electrostatic potentials at large distances from their sources, which should allow for the imaging of samples with increased surface roughness. | ||
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