This title appears in the Scientific Report :
2003
Please use the identifier:
http://dx.doi.org/10.1063/1.1541096 in citations.
Please use the identifier: http://hdl.handle.net/2128/1239 in citations.
Leakage currents in high-permittivity thin films
Leakage currents in high-permittivity thin films
Quite often leakage current data through high-permittivity thin films exhibit straight lines in the "Schottky" plot, i.e., log (current density j) versus sqrt (mean applied field), which suggests an electrode-limited current by field-enhanced thermionic emission. Unfortunately, the extract...
Saved in:
Personal Name(s): | Schroeder, H. |
---|---|
Schmitz, S. / Meuffels, P. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM |
Published in: | Applied physics letters, 82 (2003) S. 781 |
Imprint: |
Melville, NY
American Institute of Physics
2003
|
Physical Description: |
781 |
DOI: |
10.1063/1.1541096 |
Document Type: |
Journal Article |
Research Program: |
Kondensierte Materie Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Series Title: |
Applied Physics Letters
82 |
Subject (ZB): | |
Link: |
Get full text OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/1239 in citations.
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520 | |a Quite often leakage current data through high-permittivity thin films exhibit straight lines in the "Schottky" plot, i.e., log (current density j) versus sqrt (mean applied field), which suggests an electrode-limited current by field-enhanced thermionic emission. Unfortunately, the extracted permittivity at optical frequencies seldom is in agreement with experimental values and often is unacceptably small, i.e., <1. We suggest a model demonstrating that the leakage current in high-permittivity thin films is bulk-limited, but still is showing the characteristic dependence of thermionic emission. This is due to a combination of boundary conditions of the model, low-permittivity thin layers ("dead layer") at the electrodes and current injection/recombination terms at the injecting/collecting electrodes, respectively. (C) 2003 American Institute of Physics. | ||
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