This title appears in the Scientific Report :
1999
Advanced characterization tools for thin films in low-E-systems
Advanced characterization tools for thin films in low-E-systems
Saved in:
Personal Name(s): | Weis, H. |
---|---|
Müggenburg, T. / Friedrich, I. / Grosse, P. / Harlitze, L. / Wuttig, M. | |
Contributing Institute: |
Institut für Grenzflächenforschung und Vakuumphysik; IGV |
Published in: | Thin solid films, 351 (1999) S. 184 - 189 |
Imprint: |
Amsterdam [u.a.]
Elsevier
1999
|
Physical Description: |
184 - 189 |
Document Type: |
Journal Article |
Research Program: |
Grenzflächenaspekte der Informationstechnik |
Series Title: |
Thin Solid Films
351 |
Publikationsportal JuSER |
Description not available. |