This title appears in the Scientific Report :
2005
Please use the identifier:
http://dx.doi.org/10.1016/j.jnucmat.2004.10.042 in citations.
Investigation of the high temperature erosion of aluminum and nickel by 5 keV neon irradiation
Investigation of the high temperature erosion of aluminum and nickel by 5 keV neon irradiation
The erosion behaviour of Ni has been investigated in the temperature range up to 1500K under 5keV Ne ion irradiation at a flux density of approximate to 1.5 x 10(19) Ne/m(2)s. The amount and velocity distribution of thermally or ion released Ni-atoms (mass 58) has been determined by means of time of...
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Personal Name(s): | Vietzke, E. |
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Philipps, V. | |
Contributing Institute: |
Institut für Plasmaphysik; IPP |
Published in: | Journal of nuclear materials, 337-339 (2005) S. 1024 - 1028 |
Imprint: |
Amsterdam [u.a.]
Elsevier Science
2005
|
Physical Description: |
1024 - 1028 |
DOI: |
10.1016/j.jnucmat.2004.10.042 |
Document Type: |
Journal Article |
Research Program: |
Kernfusion und Plasmaforschung |
Series Title: |
Journal of Nuclear Materials
337-339 |
Subject (ZB): | |
Publikationsportal JuSER |
The erosion behaviour of Ni has been investigated in the temperature range up to 1500K under 5keV Ne ion irradiation at a flux density of approximate to 1.5 x 10(19) Ne/m(2)s. The amount and velocity distribution of thermally or ion released Ni-atoms (mass 58) has been determined by means of time of flight analysis in a differentially pumped line of sight mass spectrometer. It was found that the amount of physically sputtered atoms was constant within the experimental accuracy in the investigated temperature range. Also, no noticeable enhancement of thermally emitted particles exceeding the normal evaporation fluxes could be detected in this temperature range within the accuracy of the measurement. The accuracy amounts to about 5% of the thermally evaporated atom flux, determined mainly by the temperature stability of the target with and without ion irradiation. (c) 2004 Published by Elsevier B.V. |