This title appears in the Scientific Report :
2007
Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy of Crystalline Solids
Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy of Crystalline Solids
Saved in:
Personal Name(s): | Tillmann, K. |
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Barthel, J. / Houben, L. / Jia, C. L. / Lentzen, M. / Thust, A. / Urban, K. | |
Contributing Institute: |
Mikrostrukturforschung; IFF-8 |
Published in: |
XVth International Conference on Microscopy of Semiconducting Materials : Churchill College |
Imprint: |
2007
|
Conference: | Cambridge, United Kingdom 2007-04-02 |
Document Type: |
Conference Presentation |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |