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This title appears in the Scientific Report : 2008 

Optical band gap of BiFe03 grown by adsorption-controlled molecular-beam epitaxy

Optical band gap of BiFe03 grown by adsorption-controlled molecular-beam epitaxy

BiFeO3 thin films have been deposited on (001) SrTiO3 substrates by adsorption-controlled reactive molecular-beam epitaxy. For a given bismuth overpressure and oxygen activity, single-phase BiFeO3 films can be grown over a range of deposition temperatures in accordance with thermodynamic calculation...

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Personal Name(s): Ihlefeld, J.F.
Podraza, N. J. / Liu, Z.K. / Rai, R.C. / Xu, X. / Heeg, T. / Chen, Y.B. / Li, J. / Collins, R. W. / Musfeldt, J.L. / Pan, X. Q. / Schubert, J. / Ramesh, R. / Schlom, D. G.
Contributing Institute: Center of Nanoelectronic Systems for Information Technology; CNI
Halbleiter-Nanoelektronik; IBN-1
Published in: Applied physics letters, 92 (2008) S. 142908
Imprint: Melville, NY American Institute of Physics 2008
Physical Description: 142908
DOI: 10.1063/1.2901160
Document Type: Journal Article
Research Program: Grundlagen für zukünftige Informationstechnologien
Series Title: Applied Physics Letters 92
Subject (ZB):
J
Link: Get full text
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OpenAccess
Publikationsportal JuSER
Please use the identifier: http://hdl.handle.net/2128/17409 in citations.
Please use the identifier: http://dx.doi.org/10.1063/1.2901160 in citations.

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BiFeO3 thin films have been deposited on (001) SrTiO3 substrates by adsorption-controlled reactive molecular-beam epitaxy. For a given bismuth overpressure and oxygen activity, single-phase BiFeO3 films can be grown over a range of deposition temperatures in accordance with thermodynamic calculations. Four-circle x-ray diffraction reveals phase-pure, epitaxial films with omega rocking curve full width at half maximum values as narrow as 29 arc sec (0.008 degrees). Multiple-angle spectroscopic ellipsometry reveals a direct optical band gap at 2.74 eV for stoichiometric as well as 5% bismuth-deficient single-phase BiFeO3 films. (C) 2008 American Institute of Physics.

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