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FGGJ - Ion beam analysis, ion beam solid interaction

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FGGJ - Ion beam analysis, ion beam solid interaction

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Atomic collisions in solids. 4. physics of channeling and related phenomena: International conference on atomic collisions in solids . 4: physics of channeling and related phenomen...

Andersen, Sven Lilledal
1972

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Quantitative analysis with electron microprobes and secondary ion mass spectrometry : meeting held on October 18.-20. 1972 at the Kernforschungsanlage Jülich, Germany [E-Book] / [E...

Preuss, E. ;
1973

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Inelastic ion surface collisions: workshop : Inelastic ion surface collisions: international workshop 0002 : Hamilton, 14.08.78-16.08.78.

Kelly, R.
1979

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Inelastic ion surface collisions : proceedings of the international workshop. 0004 : Middelfart, 21.09.1982-24.09.1982.

Sigmund, P.
1983

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Electron and ion beam methods for surface analysis : international workshop : Newcastle, 23.02.81-27.02.81.

Grant, J. T.
1982

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Ion implantation, laser treatment and ion beam analysis of materials : proceedings of the international workshop : Bombay, 09.02.81-13.02.81.

Sood, D. K.
1982

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Recent theoretical (computational) developments in atomic collisions in solids : Strasbourg, France, 14-16 July 1981 : [proceedings] /

Ohtsuki, Y. H.
1983

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Quantitative microbeam analysis : Scottish universities summer school in physics 0040: proceedings : NATO advanced study institute : SUSSP 0040: proceedings : Dundee, 16.08.92-04.0...

Fitzgerald, A. G.
1993

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Beam solid interactions: fundamentals and applications: symposium : MRS fall meeting 1992 : Boston, MA, 30.11.92-04.12.92.

Nastasi, M.
1993

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Desorption induced by electronic transitions : International workshop on desorption induced by electronic transitions. 0004: proceedings : DIET. 0004: proceedings : Gloggnitz, 02.1...

Betz, G.
1990

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Ion beam analysis. 0008: abstracts : Johannesburg, 11.04.88-15.04.88.

1988

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Secondary ion mass spectrometry : International conference on secondary ion mass spectrometry. 0007: proceedings : SIMS. 0007 : Monterey, CA, 03.09.89-08.09.89.

Benninghoven, A.
1990

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Annual conference of the Microbeam Analysis Society 0009: tutorial and proceedings : Ottawa, 22.07.74-26.07.74.

1974

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Atomic collisions in solids vol 0002 : International conference on atomic collisions in solids 0005 vol 02 : Gatlinburg, TN, 24.09.73-28.09.73.

Datz, S.
1975

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Atomic collisions in solids vol 0001 : International conference on atomic collisions in solids 0005 vol 01 : Gatlinburg, TN, 24.09.73-28.09.73.

Datz, S.
1975

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Radiation effects on solid surfaces : American Chemical Society: meeting. 0170 : Chicago, IL, 25.08.75-26.08.75 /

Kaminsky, M.
1976

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Dynamic mass spectrometry. vol. 0005 : Salford, 05.07.1977-07.07.1977.

Price, D.
1978

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Material characterization using ion beams : NATO Advanced Study Institute on Material Characterization Using Ion Beams : Aleria, 29.08.76-12.09.76 /

Thomas, J. P.
1978

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Inelastic particle surface collisions : Inelastic ion surface collisions: international workshop 0003: proceedings : Feldkirchen-Westerham, 17.09.1980-19.09.1980.

Taglauer, E.
1981

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Atomic collisions in solids : International conference on atomic collisions in solids 0006 : Amsterdam, 22.09.75-26.09.75

Saris, F. W.
1976

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Print Edition 57 Electronic Edition 1

Book 58

Conference Publication

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ZB 56 IBN-3-4 6 IEK-14 5 IEK-4 4 IFF 3 IBN-1-2 1 more ... IKP 1 see all ... less ...

Benninghoven, A. 7 Bulgakov, Yu. V. 2 Datz, S. 2 Romig, A. D. 2 Sebe, T. 2 Tolk, N. H. 2 more ... Andersen, Sven Lilledal 1 Armstrong, John T. 1 Behrisch, R. 1 Betz, G. 1 Björkqvist, K. 1 Brenig, W. 1 Burns, A. R. 1 Burstein, Elias 1 Fiermans, L. 1 Fitzgerald, A. G. 1 Geiss, R. H. 1 Gooley, R. 1 Grant, J. T. 1 Heinrich, K. F. 1 Heinrich, K. F. J. 1 Hilf, E. R. 1 Johansson, N. G. E. 1 Kaminsky, M. 1 Kelly, R. 1 Lyon, P. A. 1 Mayer, James W. 1 Nastasi, M. 1 Newbury, Dale E. 1 Ohtsuki, Y. H. 1 see all ... less ...

ion beam solid interaction 8 atomic collision 6 channeling 6 desorption 6 electron microprobe analysis 5 ion beam analysis 5 more ... SIMS (secondary ion mass spectroscopy) 4 ion surface collision 4 ion scattering 3 sputtering 3 ion beam technology 2 ion source 2 microanalysis 2 radiation damage 2 secondary ion emission 2 Auger effect 1 Monte Carlo method 1 backscattering 1 beam surface interaction 1 electron microscope 1 electron microscopy 1 electron spectroscopy 1 heavy ion 1 ion accelerator 1 ion beam surface modification 1 ion channeling 1 ion counter 1 ion emission 1 ion implantation 1 ion irradiation 1 see all ... less ...

FGGJ - Ion beam analysis, ion beam solid interaction FHJC - Microbeam analysis 12 FGG - Ion beam technology 6 FFGC - Electron spectroscopy 2 FGGE - Ion beam surface modification 2 FGJ - Laser and electron beam processing 2 more ... FHAB - Surface and thin film characterization 2 CBRH - Inorganic clusters 1 CTYR - Microanalysis 1 CUW - Mass spectroscopy 1 FAF - Materials research - comprehensive works 1 FDF - Radiation effects in solids 1 FGGB - Ion implantation, ion beam synthesis 1 see all ... less ...

English 9 Multilingual 1

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