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FGGJ - Ion beam analysis, ion beam solid interaction

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FGGJ - Ion beam analysis, ion beam solid interaction

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Replacement probabilities for energetic primary atoms in crystals [E-Book] /

Dederichs, P. H.
1965

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Bestimmung der Struktur der bei Chemisorption von Wasserstoff rekonstruierten Nickel(110)-, Palladium(110)- und Kupfer(110)- Oberflächen mit Hilfe der Ionenrückstreuung [E-Book] /...

Hiller, Christian
1988

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Untersuchungen zur laserinduzierten thermischen Desorption [E-Book] /

Hartwig, H.
1978

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Quantitative analysis with electron microprobes and secondary ion mass spectrometry : meeting held on October 18.-20. 1972 at the Kernforschungsanlage Jülich, Germany [E-Book] / [E...

Preuss, E. ;
1973

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Ion-induced electron emission from solids [E-Book] /

Hofer, Wolfgang Otto
1989

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Handbook of modern ion beam materials analysis : appendices /

Wang, Yongqiang
2009

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Ion-induced electron emission from crystalline solids /

Kudo, Hiroshi.
2002

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Projected range statistics: semiconductors and related materials.

Gibbons, J. F.
1975

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Handbook of modern ion beam materials analysis /

Tesmer, Joseph R.
1995

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Ion solid interactions: fundamentals and applications.

Nastasi, M.
1996

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Atomic and ion collisions in solids and at surfaces: theory, simulation and applications.

Smith, R.
1997

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Secondary ion mass spectroscopy of solid surfaces.

Cherepin, V. T.
1987

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Pixe: a novel technique for elemental analysis.

Johansson, S. A.
1988

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Annual conference of the Microbeam Analysis Society 0013: proceedings : Ann-Arbor, MI, 19.06.78-23.06.78.

1978

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Microbeam analysis. 1980 : Annual conference of the Microbeam Analysis Society 0015 : San-Francisco, CA, 04.08.80-08.08.80.

Wittry, D. B.
1980

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High energy and heavy ion beams in materials analysis: workshop: proceedings : Albuquerque, NM, 14.06.89-16.06.89.

Tesmer, Joseph R.
1990

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Ion surface interaction, sputtering and related phenomena : Proceedings of the international conf. held at Garching, 24.-27.9.1972.

Behrisch, R.
1973

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Low incident ion energies.

Winterbon, K. B.
1975

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Stopping cross sections of elements with z equal to 2 to 87 for LI ions with energies between 80 Kev and 840 Kev.

Neuwirth, W.
1976

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Ion scattering studies of some actinide materials.

Ellis, W. P.
1977

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Print Edition 124 Electronic Edition 17

Book 142

Conference Publication 58 Theses 13 Collection of Tables 13 Report 8 Handbook, Textbook 6

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ZB 137 IEK-4 11 IEK-14 10 IKP 10 IBN-1-2 7 IBN-3-4 6 more ... IFF 4 IEK-2 2 see all ... less ...

Benninghoven, A. 8 Mayer, James W. 5 Ziegler, J. F. 4 Datz, S. 3 Gibson, W. M. 3 Kumakhov, M. A. 3 more ... Andersen, Hans Henrik 2 Archard, Geoffry D. 2 Arifov, Ubal Arifovich 2 Briggs, D. 2 Brümmer, Otto 2 Bulgakov, Yu. V. 2 Etzkorn, H. W. 2 Gibbons, J. F. 2 Johnson, W. S. 2 Komarov, F. F. 2 Littmark, U. 2 Mylroie, S. W. 2 Nastasi, M. 2 Romig, A. D. 2 Sebe, T. 2 Sigmund, P. 2 Tesmer, Joseph R. 2 Tolk, N. H. 2 Vickerman, John C. 2 Wang, Yongqiang 2 Ziegler, James F. 2 Andersen, Christian A. 1 Andersen, Sven Lilledal 1 Armstrong, John T. 1 see all ... less ...

ion beam solid interaction 15 channeling 14 ion beam analysis 12 SIMS (secondary ion mass spectroscopy) 11 desorption 8 atomic collision 7 more ... electron microprobe analysis 7 sputtering 7 ion scattering 6 backscattering 5 ion channeling 5 ion surface collision 5 radiation damage 5 ion irradiation 4 stopping power 4 surface analysis 4 Auger electron spectroscopy 3 accelerator 3 activation analysis 3 charged particle 3 energy loss 3 instrumentation 3 ion implantation 3 ion microprobe analysis 3 ion source 3 radiology 3 thin film 3 computer simulation 2 cross section 2 electron spectroscopy 2 see all ... less ...

FGGJ - Ion beam analysis, ion beam solid interaction FAAB - Solid state physics - reference books 16 FHJC - Microbeam analysis 16 FGGB - Ion implantation, ion beam synthesis 14 FGG - Ion beam technology 9 FHAB - Surface and thin film characterization 8 more ... CUW - Mass spectroscopy 3 FFGC - Electron spectroscopy 3 FFGH - Electron emission, field emission 3 FFJ - Surface structure, gas solid interface 3 CUH - Luminescence, fluorescence analysis 2 FANE - Computational solid state physics 2 FDF - Radiation effects in solids 2 FGGE - Ion beam surface modification 2 FGJ - Laser and electron beam processing 2 CBRH - Inorganic clusters 1 CTYR - Microanalysis 1 FAF - Materials research - comprehensive works 1 FDFC - Radiation effects in metals, nuclear radiation effects 1 FFPG - Multilayer systems, quantum structures 1 FHA - Materials characterization - general aspects 1 FHEE - X-ray microscopy, surface topography 1 FHEG - Tunneling microscopy, force microscopy 1 FHGE - Electron diffraction 1 FJCK - Electrical conduction in solid materials 1 FJKB - Elemental semiconductors 1 FLE - Superconductor materials 1 PGLJ - Plasma wall interaction, divertors 1 see all ... less ...

English 26 German 10 Multilingual 1

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